"Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation"
Yoichi Miyahara and Peter Grutter
Appl. Phys. Lett. 110, 163103 (2017)
Yoichi Miyahara, Antoine Roy-Gobeil and Peter Grutter
Nanotechnology 28, 064001 (2017)
Congratulation to Ann-Lauriene and Zeno for publishing in J. Chem. Phys. together
A.-L. Haag, Z. Schumacher, P. Grutter
J. Chem. Phys. 145, 154704 (2016)
A.-L. Haag, V. Toader, R. B. Lennox and P. Grutter
Nanotechnology, 27, 45, 2016
Congratulations to Zeno Schumacher for successfully defending his PhD thesis!
Congratulations to Ann-Lauriene for successfully defending her PhD thesis!
Yoichi Miyahara, Jessica Topple, Zeno Schumacher, and Peter Grutter
Phys. Rev. Appl. (2015) in press
A.-L. Haag, Y. Nagai, R. Bruce Lennox, P. Grütter
EPJ Techn. Instrum. 2015, 2:1
W. Paul, D. Oliver, Y. Miyahara, and P. Grütter
"FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion"
App. Surf. Sci (2014) in press
W. Paul, D. Oliver, and P. Grütter"Indentation-formed nanocontacts: An atomic-scale perspective"
Phys. Chem. Chem. Phys. (2014) in press
One-to-one comparisons between indentation experiments and atomistic modelling have until recently been hampered by the discrepancy in length scales of the two approaches. Here, we review progress in atomic-scale nanoindentation experiments employing scanning probe techniques to achieve depth-sensing indentation and field ion microscopy to permit detailed indenter characterization. This perspective addresses both mechanical (dislocation nucleation, defect structures, adhesion, indenter effects) and electronic (interface, disorder, and vacancy scattering) properties of indentation-formed contacts.
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