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New article presents protocol for implementing FIM tips in SPM experiments

posted Aug 4, 2012, 9:17 AM by William Paul   [ updated Aug 5, 2012, 9:57 PM ]

"Implementation of atomically defined field ion microscopy tips in scanning probe microscopy" 
Nanotechnology 23 335702 (2012); doi:10.1088/0957-4484/23/33/335702 
William Paul, Yoichi Miyahara and Peter Grütter 


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