"Electrical characterization of low dimensional systems (quantum/nano-structures)" Springer Series in Surface Sciences Vol. 48, Sprnger, 2011, pp.175-195. ISBN 978-3-642-22565-9  |
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A book chapter on Kelvin probe force microscopy publishedposted Nov 15, 2011, 7:35 AM by Yoichi Miyahara [ updated Feb 16, 2012, 5:16 PM by SPM Evaporator ]
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